標(biāo)題: X射線測(cè)量板材厚度系統(tǒng)研究 [打印本頁] 作者: 飄八零 時(shí)間: 2008-10-15 22:55 標(biāo)題: X射線測(cè)量板材厚度系統(tǒng)研究 廖平 馬洪秋 陳峰
中南大學(xué)機(jī)電工程學(xué)院,湖南長沙410083
摘 要:傳統(tǒng)測(cè)厚系統(tǒng)中采用工控機(jī)或PLC，數(shù)據(jù)處理慢，人機(jī)交互性差。針對(duì)這些缺點(diǎn)，對(duì)AT mega 16單片機(jī)在板材測(cè)厚儀上的應(yīng)用進(jìn)行研究，并比較了傳統(tǒng)的以工控機(jī)為核心的電控系統(tǒng)與以AT mega 16單片機(jī)為電控核心的系統(tǒng)的優(yōu)缺點(diǎn)。詳細(xì)介紹了測(cè)厚儀電控系統(tǒng)的組成和原理，同時(shí)對(duì)基于Delphi的測(cè)厚數(shù)據(jù)的處理方法進(jìn)行了說明。實(shí)踐表明，該系統(tǒng)控制結(jié)構(gòu)簡(jiǎn)單，有較高的運(yùn)行效率和可靠性。[著者文摘]
Research on technique of X-ray thickness gaugeLIAO Ping, MA Hong-qin,CHEN Feng College of Mechanical and Electronical Engineering, Central South University, Changsha 410083, ChinaAbstract:Conventional system of measuring thickness adopts industrial control computer or PLC, while its speed to process data is low and has poor human-machine interact capability. Aiming at these drawbacks, research on the application of AT mega 16 single chip on thickness gauge was conducted. Compare of the advantages and disadvantages of conventional electric control system taking industrial control computer as the kernel and system with AT mega 16 single chip as the electric control kernel was carried out. The composition and principle of electric control system of thickness gauge was introduced in details. Meantime, the measured thickness data process method based on Delphi was expounded. Practice indicates that control structure of this system is simple and it has high operating efficiency and reliability.[著者文摘]
Key words:X-Ray;system of measuring thickness;Delphi;AVR
