標(biāo)題: ASTM F 1711-1996 使用四點(diǎn)探測法測定專業(yè)平板顯示器用薄膜.... [打印本頁] 作者: 兌水 時間: 2009-12-2 16:59 標(biāo)題: ASTM F 1711-1996 使用四點(diǎn)探測法測定專業(yè)平板顯示器用薄膜.... F1711-96(2002) Standard Practice for Measuring Sheet Resistance of Thin Film Conductors for Flat Panel Display Manufacturing Using a Four-Point Probe