標(biāo)題: ASTM C 1282-2000 用離心光電沉淀法測(cè)定高級(jí)陶瓷粒徑分布的標(biāo)... [打印本頁(yè)] 作者: 兌水 時(shí)間: 2009-9-22 08:30 標(biāo)題: ASTM C 1282-2000 用離心光電沉淀法測(cè)定高級(jí)陶瓷粒徑分布的標(biāo)... C1282-00 Standard Test Method for Determining the Particle Size Distribution of Advanced Ceramics by Centrifugal Photosedimentation